%0 Journal Article
%K thin films
%K annealing
%K raman scattering
%K laser ablation
%K magnetoresistance
%K substrates
%K oxygen
%K raman spectroscopy
%K Phonons
%K Magnetization
%K temperature dependence
%K Magnetoresistance manganite films
%A V.B Podobedov
%A D.B Romero
%A A Weber
%A J.P Rice
%A R Schreekala
%A M Rajeswari
%A Ramamoorthy Ramesh
%A T Venkatesan
%A H.D Drew
%B Applied Physics Letters
%D 1998
%G eng
%P 3217-3219
%R 10.1063/1.122723
%T Diagnostics of "colossal" magnetoresistance manganite films by Raman spectroscopy
%V 73
%X Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown" films compared to those annealed in oxygen at 800°C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found. © 1998 American Institute of Physics.