Atomically defined rare-earth scandate crystal surfaces

Publication Type	Journal Article

Authors	J.E Kleibeuker G Koster W Siemons D Dubbink B Kuiper J.L Blok C.-H Yang J Ravichandran Ramamoorthy Ramesh J.E Elshof D.H.A Blank G Rijnders
DOI	10.1002/adfm.201000889
Abstract	{The fabrication of well-defined, atomically sharp substrate surfaces over a wide range of lattice parameters is reported, which is crucial for atomically regulated epitaxial growth of complex oxide heterostructures. By applying a framework for controlled selective wet etching of complex oxides on the stable rare-earth scandates (REScO3)
Notes	cited By 59
Journal	Advanced Functional Materials
Volume	20
Year of Publication	2010
Number	20
Pagination	3490-3496
ISSN Number	1616301X
Keywords	Thin films Mass spectrometry Perovskite Film growth Morphology Epitaxial growth Complex oxides Surface treatment Substrate surface Time-of-flight mass spectroscopy Basic solutions Chemical sensitivity Crystal surfaces Lattice parameters Perovskite type oxides Pseudocubic Scandates Selective wet etching Single termination Spectroscopy measurements Time of flight Wet etching
Research Areas	Ramesh Lab
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