%0 Journal Article
%K thin films
%K mass spectrometry
%K Perovskite
%K film growth
%K morphology
%K Epitaxial growth
%K Complex oxides
%K Surface treatment
%K Substrate surface
%K Time-of-flight mass spectroscopy
%K Basic solutions
%K Chemical sensitivity
%K Crystal surfaces
%K Lattice parameters
%K Perovskite type oxides
%K Pseudocubic
%K Scandates
%K Selective wet etching
%K single termination
%K Spectroscopy measurements
%K Time of flight
%K Wet etching
%A J.E Kleibeuker
%A G Koster
%A W Siemons
%A D Dubbink
%A B Kuiper
%A J.L Blok
%A C.-H Yang
%A J Ravichandran
%A Ramamoorthy Ramesh
%A J.E Elshof
%A D.H.A Blank
%A G Rijnders
%B Advanced Functional Materials
%D 2010
%G eng
%P 3490-3496
%R 10.1002/adfm.201000889
%T Atomically defined rare-earth scandate crystal surfaces
%V 20
%X {The fabrication of well-defined, atomically sharp substrate surfaces over a wide range of lattice parameters is reported, which is crucial for atomically regulated epitaxial growth of complex oxide heterostructures. By applying a framework for controlled selective wet etching of complex oxides on the stable rare-earth scandates (REScO3)