Random walk process

Gruverman, A, H Tokumoto, A.S Prakash, S Aggarwal, B Yang, M Wuttig, Ramamoorthy Ramesh, O Auciello, and T Venkatesan. "Nanoscale imaging of domain dynamics and retention in ferroelectric thin films." Applied Physics Letters 71 (1997) 3492–3494.

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