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Characterization

Reade, Ronald P, Xianglei Mao, and Richard E Russo. "Characterization of Y-Ba-Cu-O Thin-Films and Yttria-Stabilized Zirconia Intermediate Layers on Metal-Alloys Grown by Pulsed Laser Deposition." Applied Physics Letters 59.6 (1991) 739–741.

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Perry, Dale L, Albert C Thompson, Richard E Russo, Xianglei Mao, and Karen L Chapman. "Characterization of quaternary metal oxide films by synchrotron X-ray fluorescence microprobe." Applied Spectroscopy 51.12 (1997) 1781–1783.

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Faulques, Eric, and Richard E Russo. "Characterization of High Temperature Superconductors with Raman Spectroscopy." Applications of Analytical Techniques to the Characterization of Materials. Ed. Dale L Perry. New York: Plenum Press, 1992. 59–100.

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