TY - JOUR KW - Deposition KW - Thin films KW - Pulsed laser deposition KW - Characterization KW - Film KW - Films KW - Thin KW - Thin film KW - Thin-film KW - Thin films KW - Laser KW - Applications KW - Superconducting KW - Y-ba-cu-o KW - Ybacuo KW - Layers KW - Oriented KW - Oxide KW - P KW - Time KW - No KW - Process KW - Alloy KW - Alloys KW - Pulsed laser KW - Pulsed laser KW - Metallic KW - Substrate KW - Substrates KW - Layer KW - Circulation KW - Deposited KW - Intermediate KW - K KW - Laser deposition KW - Polycrystalline KW - Pulsed laser deposition KW - Ysz KW - Yttria stabilized zirconia KW - Yttria stabilized zirconia KW - Zirconia KW - Zirconium KW - Buffer layers KW - Deposition process KW - Growth KW - Metallic alloys KW - Si KW - Tape KW - Yba2cu3o7-delta KW - Ybacuo thin films AU - Ronald P Reade AU - Xianglei Mao AU - Richard E Russo AB -
The use of an intermediate layer is necessary for the growth of YBaCuO thin films on polycrystalline metallic alloys for tape conductor applications. A pulsed laser deposition process to grow controlled‐orientation yttria‐stabilized zirconia (YSZ) films as intermediate layers on Haynes Alloy No. 230 was developed and characterized. YBaCuO films deposited on these YSZ‐coated substrates are primarily c‐axis oriented and superconducting as deposited. The best YBaCuO films grow on (001) oriented YSZ intermediate layers and have Tc (R=0) = 86.0 K and Jc ∼ 3×103 A/cm2 at 77 K.
BT - Applied Physics Letters C2 - LBNL-30855 DA - 08/1991 DO - 10.1063/1.105329 IS - 6 LA - eng LB - Laser N2 -The use of an intermediate layer is necessary for the growth of YBaCuO thin films on polycrystalline metallic alloys for tape conductor applications. A pulsed laser deposition process to grow controlled‐orientation yttria‐stabilized zirconia (YSZ) films as intermediate layers on Haynes Alloy No. 230 was developed and characterized. YBaCuO films deposited on these YSZ‐coated substrates are primarily c‐axis oriented and superconducting as deposited. The best YBaCuO films grow on (001) oriented YSZ intermediate layers and have Tc (R=0) = 86.0 K and Jc ∼ 3×103 A/cm2 at 77 K.
PY - 1991 SP - 739 EP - 741 ST - Appl. Phys. Lett. T2 - Applied Physics Letters TI - Characterization of Y-Ba-Cu-O Thin-Films and Yttria-Stabilized Zirconia Intermediate Layers on Metal-Alloys Grown by Pulsed Laser Deposition VL - 59 ER -