Observation of domain walls in PbZr0.2 Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy
| Publication Type | Journal Article
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| Authors | |
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| DOI |
10.1063/1.1609252
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| Abstract |
The observation of domain walls in PbZr0.2Ti0.8O 3 thin film using scanning nonlinear dielectric microscopy was presented. The linear dielectric constant of a domains and c domains was measured. It was found that the 180° c-c domain wall was smaller than the 90° a-c domain wall.
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| Notes |
cited By 20
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| Journal |
Applied Physics Letters
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| Volume |
83
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| Year of Publication |
2003
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| Number |
13
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| Pagination |
2650-2652
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| ISSN Number |
00036951
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| Keywords | |
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