J.H Liu

Liu, Z.Q, J.H Liu, M.D Biegalski, J.-M Hu, S.L Shang, Y Ji, J.M Wang, S.L Hsu, A.T Wong, M.J Cordill, B Gludovatz, C Marker, H Yan, Z.X Feng, L You, M.W Lin, T.Z Ward, Z.K Liu, C.B Jiang, L.Q Chen, R.O Ritchie, H.M Christen, and Ramamoorthy Ramesh. "Electrically reversible cracks in an intermetallic film controlled by an electric field." Nature Communications 9 (2018).