TY - JOUR
KW - Film
KW - Substrate
KW - Electric field
KW - Frequency analysis
KW - Instrumentation
KW - Thin section
AU - Z.Q Liu
AU - J.H Liu
AU - M.D Biegalski
AU - J.-M Hu
AU - S.L Shang
AU - Y Ji
AU - J.M Wang
AU - S.L Hsu
AU - A.T Wong
AU - M.J Cordill
AU - B Gludovatz
AU - C Marker
AU - H Yan
AU - Z.X Feng
AU - L You
AU - M.W Lin
AU - T.Z Ward
AU - Z.K Liu
AU - C.B Jiang
AU - L.Q Chen
AU - R.O Ritchie
AU - H.M Christen
AU - Ramamoorthy Ramesh
AB - Cracks in solid-state materials are typically irreversible. Here we report electrically reversible opening and closing of nanoscale cracks in an intermetallic thin film grown on a ferroelectric substrate driven by a small electric field ( 0.83 kV/cm). Accordingly, a nonvolatile colossal electroresistance on-off ratio of more than 108 is measured across the cracks in the intermetallic film at room temperature. Cracks are easily formed with low-frequency voltage cycling and remain stable when the device is operated at high frequency, which offers intriguing potential for next-generation high-frequency memory applications. Moreover, endurance testing demonstrates that the opening and closing of such cracks can reach over 107 cycles under 10-μs pulses, without catastrophic failure of the film. © 2017 The Author(s).
BT - Nature Communications
DO - 10.1038/s41467-017-02454-8
LA - eng
M1 - 1
N1 - cited By 18
N2 - Cracks in solid-state materials are typically irreversible. Here we report electrically reversible opening and closing of nanoscale cracks in an intermetallic thin film grown on a ferroelectric substrate driven by a small electric field ( 0.83 kV/cm). Accordingly, a nonvolatile colossal electroresistance on-off ratio of more than 108 is measured across the cracks in the intermetallic film at room temperature. Cracks are easily formed with low-frequency voltage cycling and remain stable when the device is operated at high frequency, which offers intriguing potential for next-generation high-frequency memory applications. Moreover, endurance testing demonstrates that the opening and closing of such cracks can reach over 107 cycles under 10-μs pulses, without catastrophic failure of the film. © 2017 The Author(s).
PB - Nature Publishing Group
PY - 2018
T2 - Nature Communications
TI - Electrically reversible cracks in an intermetallic film controlled by an electric field
VL - 9
SN - 20411723
ER -