Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Publication Type
Journal Article
Authors
DOI
10.1103/PhysRevLett.101.107602
Abstract
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.
Notes
cited By 186
Journal
Physical Review Letters
Volume
101
Year of Publication
2008
Number
10
ISSN Number
00319007
Keywords
Research Areas
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