TY - JOUR
KW - Thin films
KW - Polarization
KW - Rotation
KW - Spontaneous polarizations
KW - Epitaxial films
KW - Induced polarization
KW - Thick films
KW - Thermoanalysis
AU - H.W Jang
AU - S.H Baek
AU - D Ortiz
AU - C.M Folkman
AU - R.R Das
AU - Y.H Chu
AU - P Shafer
AU - J.X Zhang
AU - S Choudhury
AU - V Vaithyanathan
AU - Y.B Chen
AU - D.A Felker
AU - M.D Biegalski
AU - M.S Rzchowski
AU - X.Q Pan
AU - D.G Schlom
AU - L.Q Chen
AU - Ramamoorthy Ramesh
AU - C.B Eom
AB - Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.
BT - Physical Review Letters
DO - 10.1103/PhysRevLett.101.107602
LA - eng
M1 - 10
N1 - cited By 186
N2 - Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.
PY - 2008
T2 - Physical Review Letters
TI - Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films
VL - 101
SN - 00319007
ER -