@article{33576,
  keywords = {Thin films, Polarization, Rotation, Spontaneous polarizations, Epitaxial films, Induced polarization, Thick films, Thermoanalysis},
  author = {H.W Jang and S.H Baek and D Ortiz and C.M Folkman and R.R Das and Y.H Chu and P Shafer and J.X Zhang and S Choudhury and V Vaithyanathan and Y.B Chen and D.A Felker and M.D Biegalski and M.S Rzchowski and X.Q Pan and D.G Schlom and L.Q Chen and Ramamoorthy Ramesh and C.B Eom},
  title = {Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films},
  abstract = {Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.},
  year = {2008},
  journal = {Physical Review Letters},
  volume = {101},
  number = {10},
  issn = {00319007},
  doi = {10.1103/PhysRevLett.101.107602},
  note = {cited By 186},
  language = {eng},
}