Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films
| Date Published |
02/1998
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|---|---|
| Publication Type | Journal Article
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| Authors | |
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| DOI |
10.1016/S0040-6090(97)00994-2
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| Abstract |
In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle. |
| Journal |
Thin Solid Films
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| Volume |
313-314
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| Year of Publication |
1998
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| Pagination |
775-780
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