Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

Date Published
02/1998
Publication Type
Journal Article
Authors
DOI
10.1016/S0040-6090(97)00994-2
Abstract

In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.

Journal
Thin Solid Films
Volume
313-314
Year of Publication
1998
Pagination
775-780
Keywords
Organizations
Research Areas
Download citation