%0 Journal Article
%K effective medium approximation
%K electrochemical precipitation
%K inhomogeneous films
%K nickel hydroxide
%K spectroscopic ellipsometry
%A Fanping Kong
%A Robert Kostecki
%A Frank R McLarnon
%A Rolf H Muller
%B Thin Solid Films
%D 1998
%F Electrochem
%G eng
%P 775-780
%R 10.1016/S0040-6090(97)00994-2
%T Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films
%V 313-314
%8 02/1998
%X <p>In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm<sup>3</sup>. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.</p>