In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.
BT - Thin Solid Films DA - 02/1998 DO - 10.1016/S0040-6090(97)00994-2 LA - eng LB - Electrochem N2 -In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.
PY - 1998 SP - 775 EP - 780 T2 - Thin Solid Films TI - Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films VL - 313-314 ER -