Intrinsic effective piezoelectric coefficient e 31,f for ferroelectric thin films

Publication Type
Journal Article
Authors
DOI
10.1063/1.1899252
Abstract
As a function of film orientation, the intrinsic effective piezoelectric coefficient e31,f is generally formulated for a substrate-constrained ferroelectric film. Numerical results are obtained for Pb (Zrx Ti1-x) O3 (PZT) thin films with tetragonal and rhombohedral compositions. It is illustrated that the optimal orientation for e31,f are close to [001] orientation in both tetragonal and rhombohedral PZT films and the maximum calculated e31,f is about -30 Cm2 on the rhombohedral side of the morphotropic phase boundary. © 2005 American Institute of Physics.
Notes
cited By 18
Journal
Applied Physics Letters
Volume
86
Year of Publication
2005
Number
15
Pagination
1-3
ISSN Number
00036951
Keywords
Research Areas
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