Improvement in spin-wave resonance characteristics of epitaxial barium-ferrite thin films by using an aluminum-doped strontium-ferrite buffer layer
Publication Type | Journal Article
|
---|
Authors | |
---|---|
DOI |
10.1063/1.123156
|
Abstract |
We report on the effects of using SrFe7Al5O19 as a buffer layer for growth of high-quality epitaxial barium-ferrite thin films on sapphire substrates. X-ray diffraction studies reveal that the buffer layer causes the interfacial strains in the barium-ferrite films to relax. As a result, the ferromagnetic resonance linewidth decreases even in the as-deposited case. However, the more striking result is the drastic reduction in the linewidth that occurs when the barium-ferrite film is deposited on the buffer layer and subsequently annealed at 1000°C for 2 h, allowing the observation of a large number of spin-wave resonances (up to the 15th mode), indicating an improvement in both the surface and interface characteristics. © 1999 American Institute of Physics.
|
Notes |
cited By 23
|
Journal |
Applied Physics Letters
|
Volume |
74
|
Year of Publication |
1999
|
Number |
4
|
Pagination |
594-596
|
Publisher |
American Institute of Physics Inc.
|
ISSN Number |
00036951
|
Research Areas | |
Download citation |