Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy
| Publication Type | Conference Paper
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| Abstract |
Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.
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| Notes |
cited By 0
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| Conference Name |
OSA Trends in Optics and Photonics Series
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| Volume |
88
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| Year of Publication |
2003
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| Pagination |
1685-1686
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| Publisher |
Optical Society of American (OSA)
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| ISSN Number |
10945695
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