TY - CPAPER
KW - Thin films
KW - Electrodes
KW - Sapphire
KW - Spatial resolution
KW - Electric fields
KW - Ferroelectric materials
KW - Near-field scanning optical microscopy
KW - Imaging techniques
KW - Natural frequencies
KW - Second harmonic generation
KW - Metal structures
KW - Sub-micrometers
AU - H.Y Liang
AU - I.I Smolyaninov
AU - J Li
AU - V Nagarajan
AU - Ramamoorthy Ramesh
AU - C.C Davis
AU - C.H Lee
AB - Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.
BT - OSA Trends in Optics and Photonics Series
LA - eng
N1 - cited By 0
N2 - Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.
PB - Optical Society of American (OSA)
PY - 2003
SP - 1685
EP - 1686
T2 - OSA Trends in Optics and Photonics Series
T3 - OSA Trends in Optics and Photonics Series
TI - Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy
VL - 88
SN - 10945695
ER -