@inproceedings{33699,
  keywords = {thin films, electrodes, sapphire, spatial resolution, Electric fields, Ferroelectric materials, Near field scanning optical microscopy, Imaging techniques, Natural frequencies, Second harmonic generation, Metal structures, Sub-micrometers},
  author = {H.Y Liang and I.I Smolyaninov and J Li and V Nagarajan and Ramamoorthy Ramesh and C.C Davis and C.H Lee},
  title = {Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy},
  abstract = {Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.},
  year = {2003},
  journal = {OSA Trends in Optics and Photonics Series},
  volume = {88},
  pages = {1685-1686},
  publisher = {Optical Society of American (OSA)},
  issn = {10945695},
  note = {cited By 0},
  language = {eng},
}