Defect states

Chan, James S, Nathan W Cheung, Lawrence F Schloss, Erin C Jones, William S Wong, Nathan Newman, Xiaohong Liu, Eicke R Weber, A Gassman, and Michael D Rubin. "Thermal Annealing Characteristics of Si and Mg-implanted GaN Thin Films." Applied Physics Letters 68.19 (1995) 2702–2704.

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