Intrinsic effective piezoelectric coefficient e 31,f for ferroelectric thin films
Publication Type | Journal Article
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Authors | |
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DOI |
10.1063/1.1899252
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Abstract |
As a function of film orientation, the intrinsic effective piezoelectric coefficient e31,f is generally formulated for a substrate-constrained ferroelectric film. Numerical results are obtained for Pb (Zrx Ti1-x) O3 (PZT) thin films with tetragonal and rhombohedral compositions. It is illustrated that the optimal orientation for e31,f are close to [001] orientation in both tetragonal and rhombohedral PZT films and the maximum calculated e31,f is about -30 Cm2 on the rhombohedral side of the morphotropic phase boundary. © 2005 American Institute of Physics.
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Notes |
cited By 18
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Journal |
Applied Physics Letters
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Volume |
86
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Year of Publication |
2005
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Number |
15
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Pagination |
1-3
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ISSN Number |
00036951
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Keywords | |
Research Areas | |
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