Atomic structure of highly strained BiFeO 3 thin films
Publication Type | Journal Article
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Authors | |
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DOI |
10.1103/PhysRevLett.108.047601
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Abstract |
We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.
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Notes |
cited By 79
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Journal |
Physical Review Letters
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Volume |
108
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Year of Publication |
2012
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Number |
4
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ISSN Number |
00319007
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Keywords |
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Research Areas | |
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