%0 Journal Article
%K Thin films
%K Electron energy loss spectroscopy
%K Transmission electron microscopy
%K Dissociation
%K Multiferroics
%K Scanning transmission electron microscopy
%K Atoms
%K Bismuth
%K Electronic structure
%K Highly strained
%K Atomic-resolution
%K Direct imaging
%K Fe atoms
%K R phase
%K Spontaneous polarizations
%K T-phase
%K Atomic spectroscopy
%K Electron energy levels
%K Electron scattering
%A M.D Rossell
%A R Erni
%A M.P Prange
%A J.-C Idrobo
%A W Luo
%A R.J Zeches
%A S.T Pantelides
%A Ramamoorthy Ramesh
%B Physical Review Letters
%D 2012
%G eng
%R 10.1103/PhysRevLett.108.047601
%T Atomic structure of highly strained BiFeO 3 thin films
%V 108