@article{33474,
  keywords = {thin films, Electron energy loss spectroscopy, transmission electron microscopy, dissociation, Multiferroics, scanning transmission electron microscopy, Atoms, bismuth, Electronic structure, Highly strained, Atomic-resolution, Direct imaging, Fe atoms, R phase, Spontaneous polarizations, T-phase, Atomic spectroscopy, Electron energy levels, Electron scattering},
  author = {M.D Rossell and R Erni and M.P Prange and J.-C Idrobo and W Luo and R.J Zeches and S.T Pantelides and Ramamoorthy Ramesh},
  title = {Atomic structure of highly strained BiFeO 3 thin films},
  abstract = {We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO 3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO 3 thin films. © 2012 American Physical Society.},
  year = {2012},
  journal = {Physical Review Letters},
  volume = {108},
  number = {4},
  issn = {00319007},
  doi = {10.1103/PhysRevLett.108.047601},
  note = {cited By 79},
  language = {eng},
}