MBE growth of ferromagnetic metastable epitaxial MnAl thin films on AlAs/GaAs heterostructures

Publication Type
Journal Article
Authors
DOI
10.1016/0022-0248(91)91118-T
Abstract
Epitaxial ferromagnetic films of τ-MnAl in thickness from 3 to 60 nm have been successfully grown on AlAs/GaAs heterostructures using the molecular beam epitaxy (MBE) growth technique. This magnetic phase is a non-equilibrium metastable structure, stabilized in part by its close epitaxial registry with the underlying III-V semiconductor. The growth window is very narrow due to the metastability of the τ-phase. Growth has been achieved through the use of predeposited MnAl template layers of 1-3 bilayers, which effectively separate the nucleation and growth steps. Template formation and subsequent metal growth are monitored by reflection high energy electron diffraction (RHEED). RHEED has also been used to monitor preliminary attempts at III-V semiconductor overgrowth on the magnetic MnAl films. The data indicate that the overgrowth proceeds in a three-dimensional island growth mode of single crystal III-V semiconductor. © 1991.
Notes
cited By 31
Journal
Journal of Crystal Growth
Volume
111
Year of Publication
1991
Number
1-4
Pagination
978-983
ISSN Number
00220248
Keywords
Research Areas
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