Direct Real-Time Determination of Compositional Profiles in Structured Materials Using Laser Ablation Instruments: LIBS and LA-ICP-MS

Date Published	06/2012
Publication Type	Conference Paper

Authors	Alexander A Bol'shakov Jong-Hyun Yoo Jhanis J Gonzalez Chunyi Liu Richard E Russo
DOI	10.1364/AIO.2012.ATu1A.1
Abstract	Laser ablation offers rapid micro-analysis with spatial resolution ~10 nm in depth, ~3 μm lateral. Structured materials are mapped, depth-profiled for elemental and isotopic composition using LIBS or LA-ICP-MS without dissolving samples. Molecular structure can be inferred by chemometric processing.
Proceedings Title	Applied Industrial Optics: Spectroscopy, Imaging and Metrology
Conference Name	Applied Industrial Optics: Spectroscopy, Imaging and Metrology
Year of Publication	2012
Publisher	Optical Society of America
Conference Location	Monterey, CA
Organizations	Laser Technologies Group Energy Technologies & Systems Division
Research Areas	No Research Area
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