Direct Real-Time Determination of Compositional Profiles in Structured Materials Using Laser Ablation Instruments: LIBS and LA-ICP-MS
| Date Published |
06/2012
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|---|---|
| Publication Type | Conference Paper
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| Authors | |
|---|---|
| DOI |
10.1364/AIO.2012.ATu1A.1
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| Abstract |
Laser ablation offers rapid micro-analysis with spatial resolution ~10 nm in depth, ~3 μm lateral. Structured materials are mapped, depth-profiled for elemental and isotopic composition using LIBS or LA-ICP-MS without dissolving samples. Molecular structure can be inferred by chemometric processing. |
| Conference Name |
Applied Industrial Optics: Spectroscopy, Imaging and Metrology
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| Year of Publication |
2012
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| Publisher |
Optical Society of America
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| Conference Location |
Monterey, CA
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| Organizations | |
| Download citation |