Activation field of ferroelectric (Pb,La)(Zr,Ti)O3 thin film capacitors

Publication Type
Journal Article
Authors
DOI
10.1063/1.119383
Abstract
We report results on the activation field and frequency dependence of the coercive voltage in epitaxial ferroelectric thin film capacitors. Frequency dependent hysteresis loops and pulse width dependent polarization of epitaxial La0.5Sr0.5CoO3/(Pb,La)(Zr,Ti)O 3/La0.5Sr0.5CoO3 capacitor structures were measured as a function of La content. The coercive voltages and their frequency dependence vary systematically with increasing La content. We show that the activation field for polarization reversal is directly related to the c/a ratio (tetragonality ratio) of the ferroelectric layer. A larger c/a ratio leads to a larger field to activate the motion of domain walls through the lattice. An important consequence of a larger activation field is a stronger pulse width dependence of the pulse switched polarization. © 1997 American Institute of Physics.
Notes
cited By 52
Journal
Applied Physics Letters
Volume
71
Year of Publication
1997
Number
15
Pagination
2211-2213
Publisher
American Institute of Physics Inc.
ISSN Number
00036951
Research Areas
Download citation