Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface
Publication Type | Journal Article
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Authors | |
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DOI |
10.1103/PhysRevB.83.020103
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Abstract |
At the heterointerface of a top ferroelectric Pb(Zr0.2Ti 0.8)O3 (PZT) ultrathin film and a bottom La 0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film. © 2011 American Physical Society.
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Notes |
cited By 15
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Journal |
Physical Review B - Condensed Matter and Materials Physics
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Volume |
83
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Year of Publication |
2011
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Number |
2
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ISSN Number |
10980121
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Research Areas | |
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