@article{33507,
  author = {C.-L Wu and P.-W Lee and Y.-C Chen and L.-Y Chang and C.-H Chen and C.-W Liang and P Yu and Q He and Ramamoorthy Ramesh and Y.-H Chu},
  title = {Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface},
  abstract = {At the heterointerface of a top ferroelectric Pb(Zr0.2Ti 0.8)O3 (PZT) ultrathin film and a bottom La 0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film. © 2011 American Physical Society.},
  year = {2011},
  journal = {Physical Review B - Condensed Matter and Materials Physics},
  volume = {83},
  number = {2},
  issn = {10980121},
  doi = {10.1103/PhysRevB.83.020103},
  note = {cited By 15},
  language = {eng},
}