A Stanishefsky

Publications

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2001

Schmitz, T, K Prume, S Tiedke, A Roelofs, T Schneller, U Kall, M Grossmann, R Waser, C Ganpule, A Stanishefsky, and Ramamoorthy Ramesh. "Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors." Integrated Ferroelectrics. Vol. 37. 2001. 163–172.