Structured illumination with thermal imaging (SI-TI): A dynamically reconfigurable metrology for parallelized thermal transport characterization

Date Published
06/2022
Publication Type
Journal Article
Authors
DOI
10.1063/5.0079842
Journal
Applied Physics Reviews
Volume
9
Year of Publication
2022
Issue
2
Pagination
021411
URL
Short Title
Applied Physics Reviews
Refereed Designation
Refereed
Organizations
Research Areas
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