Structured illumination with thermal imaging (SI-TI): A dynamically reconfigurable metrology for parallelized thermal transport characterization
Date Published |
06/2022
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Publication Type | Journal Article
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Authors | |
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DOI |
10.1063/5.0079842
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Journal |
Applied Physics Reviews
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Volume |
9
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Year of Publication |
2022
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Issue |
2
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Pagination |
021411
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URL | |
Short Title |
Applied Physics Reviews
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Refereed Designation |
Refereed
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Organizations | |
Research Areas | |
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