Structure and properties of ferroelectric PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures

Publication Type
Journal Article
Authors
DOI
10.1007/BF02655618
Abstract
Epitaxial thin film PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures have been grown on single crystal LaA103 by in-situ pulsed laser deposition. Structural characterization by x-ray diffraction, and transmission electron microscopy reveals that the films are typically c-axis oriented with a small fraction of a-axis oriented material, that is deposition condition dependent. The electrical properties change systematically with the crystalline quality and the best properties are obtained at higher temperatures. Above 715‡ C, there is progressive loss of lead and the electrical properties are diminished. © 1992 TMS.
Notes
cited By 8
Journal
Journal of Electronic Materials
Volume
21
Year of Publication
1992
Number
5
Pagination
513-518
Publisher
Springer-Verlag
ISSN Number
03615235
Keywords
Research Areas
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