In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation
| Date Published |
08/2010
|
|---|---|
| Publication Type | Journal Article
|
| Authors | |
|---|---|
| DOI |
10.1016/j.jpowsour.2010.02.013
|
| Journal |
Journal of Power Sources
|
| Volume |
195
|
| Year of Publication |
2010
|
| Issue |
15
|
| Pagination |
5062-5066
|
| Organizations | |
| Download citation |