Interfacial layer

Chang, C.C, T Venkatesan, M.S Hegde, D.M Hwang, Ramamoorthy Ramesh, C.T Rogers, A Frenkel, E.W Chase, L Nazar, X.D Wu, and A Inam. "Electron microscopy and spectroscopy for characterization of surface and film properties of high temperature superconductors." Proceedings of SPIE - The International Society for Optical Engineering 1187 (1990) 216–226.

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