Structured illumination with thermal imaging (SI-TI): A dynamically reconfigurable metrology for parallelized thermal transport characterization
| Date Published |
06/2022
|
|---|---|
| Publication Type | Journal Article
|
| Authors | |
|---|---|
| DOI |
10.1063/5.0079842
|
| Journal |
Applied Physics Reviews
|
| Volume |
9
|
| Year of Publication |
2022
|
| Issue |
2
|
| Pagination |
021411
|
| URL | |
| Short Title |
Applied Physics Reviews
|
| Refereed Designation |
Refereed
|
| Organizations | |
| Research Areas | |
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