In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation

Date Published	08/2010
Publication Type	Journal Article

Authors	Vijay A Sethuraman Michael J Chon Maxwell Shimshak Venkat Srinivasan Pradeep R Guduru
DOI	10.1016/j.jpowsour.2010.02.013
Journal	Journal of Power Sources
Volume	195
Year of Publication	2010
Issue	15
Pagination	5062-5066
Organizations	Energy Storage Group Energy Technologies & Systems Division Battery Group
Research Areas	No Research Area
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