Pulse I-V characteristics measurement to study dissipation mechanism in epitaxial YBaCuO thin films at high current densities
Date Published |
02/1993
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Publication Type | Journal Article
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Authors | |
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DOI |
10.1016/0921-4534(93)90533-V
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Abstract |
A simple pulse method of measuring current-voltage characteristics (I-V) at high current densities is described. We report I-Vs on epitaxial YBa2Cu3Ox thin films at high current densities in the presence of a magnetic field parallel to the c-axis. The results show that the Bardeen-Stephen flux flow model does not account for dissipation at high current densities in YBa2Cu3Ox thin films. In the presence of a magnetic field, we find qualitative agreement with a simple theoretical model based on dissipation caused by 2D vortices excited from the flux lines. In the absence of a magnetic field, a power law behavior arises due to current-induced depairing of thermally excited 2D vortices. |
Notes |
NOT IN FILE |
Journal |
Physica C: Superconductivity
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Volume |
206
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Year of Publication |
1993
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Issue |
3-4
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Pagination |
335-344
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Accession Number |
35
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Keywords | |
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