%0 Journal Article
%A Peter Dudenas
%A Adam Z Weber
%A Ahmet Kusoglu
%B Journal of Applied Crystallography
%D 2020
%G eng
%N 6
%P 1484 - 1492
%R 10.1107/S160057672001304710.1107/S1600576720013047/ge5076sup1.pdf
%T Electric-field-intensity-modulated scattering as a thin-film depth probe
%V 53
%8 11/2020
%! J Appl Crystallography