%0 Journal Article
%A M I Khan
%A Sean D Lubner
%A D F Ogletree
%A Christopher Dames
%B Journal of Applied Physics
%D 2018
%G eng
%N 19
%P 195104
%R 10.1063/1.5050250
%T Temperature dependence of secondary electron emission: A new route to nanoscale temperature measurement using scanning electron microscopy
%V 124
%8 11/2018
%! Journal of Applied Physics