%0 Conference Paper
%K Reliability
%K Thin films
%K Heterostructures
%K Ferroelectric materials
%K Ferroelectric devices
%K Capacitors
%K Lead zirconate titanate (PZT)
%K Semiconducting silicon
%K Lanthanum strontium cobalt oxide
%K Aging characteristics
%K Fatigue characteristics
%K Reliability testing
%A Ramamoorthy Ramesh
%A T Sands
%A V.G Keramidas
%A D.K Fork
%A Myers R
%A Tuttle Bruce A
%A Desu Seshu B
%A Larsen Poul K
%B Proceedings of the Materials Research Society Symposium -
%D 1993
%G eng
%I Publ by Materials Research Society, Pittsburgh, PA, United States
%P 195-200
%S Materials Research Society Symposium -
%T Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon: reliability testing
%V 310