%0 Journal Article
%K Thin films
%K Ablation
%K Superconducting films
%K Scanning electron microscopy
%K Pulsed laser ablation (PLA)
%K Crystal growth
%K Ferroelectric materials
%K High temperature superconductors
%K Interfaces (materials)
%K Laser pulses
%K Crystal microstructure
%K X-ray spectroscopy
%K Lead titanate thin films
%K Thermal expansion mismatch
%A S.G Ghonge
%A E Goo
%A Ramamoorthy Ramesh
%B Applied Physics Letters
%D 1993
%G eng
%P 1742-1744
%R 10.1063/1.109592
%T Microstructure of c-axis oriented lead titanate thin films by pulsed laser ablation
%V 62
%X Epitaxial ferroelectric PbTiO3/YBa2Cu 3O7-x heterostructures have been fabricated on [001] LaAlO3 by pulsed laser ablation. X-ray diffractometer scans showed only the (00l) peaks from the lead titanate and YBa2Cu 3O7-x film indicating c-axis growth. Transmission electron microscopy on planar and cross-sectional samples revealed a single domain film. The c-axis orientation in the lead titanate film is ascribed to the good lattice match of the a-axis of lead titanate with the a- or b-axes of the YBa2Cu3O7-x film. A cubic lead titanate film is deposited above the Curie point. Compressive stresses arise in the lead titanate film due to lattice mismatch. The c-axis orientation is favored since it reduces the compressive residual stresses.