%0 Journal Article
%K deposition
%K lattice constants
%K multilayers
%K lanthanum compounds
%K Strontium compounds
%K Magnetization
%K X ray crystallography
%K strontium titanate
%K Ferromagnetic resonance
%K Thermal effects
%K SQUIDs
%K Rutherford backscattering spectroscopy
%K Mathematical models
%K Magnetic resonance
%K Deposition temperature
%K Lanthanum barium manganate
%K Magnetic homogeneity
%K Portis modes
%K Spin wave resonance
%A M.C Robson
%A C Kwon
%A K.-C Kim
%A R.P Sharma
%A T Venkatesan
%A S.E Lofland
%A S.M Bhagat
%A Ramamoorthy Ramesh
%A M Dominguez
%A S.D Tyagi
%B Journal of Applied Physics
%D 1996
%G eng
%I American Institute of Physics Inc.
%P 2334-2338
%R 10.1063/1.363066
%T Characterization of epitaxial La0.7Ba0.3MnO3 structures using ferromagnetic resonance
%V 80
%X We have compared a single layer of La0.7Ba0.3MnO3 and a trilayer structure of SrTiO3/La0.7Ba0.3MnO3/SrTiO 3, both grown epitaxially on a LaAlO3 substrate, using information obtained by ferromagnetic resonance (FMR). The trilayer samples have a more uniform magnetization and are not susceptible to environmental degradation. This may be due to the strain relief that the buffer SrTiO3 layer provides for the La0.7Ba0.3MnO3 layer. We have also studied the magnetic homogeneity of the trilayer structure as a function of the deposition temperature. The perpendicular FMR linewidth, Γ⊥, shows a clear window in the deposition temperature where the linewidth is <50 Oe. However, the parallel linewidth, Γ|, is nearly ten times larger than Γ⊥ with only a weak dependence on the deposition temperature. This broadening of the parallel linewidth compared to the perpendicular linewidth can be explained by invoking a local unidirectional anisotropy in the plane of the film. © 1996 American Institute of Physics.