%0 Journal Article
%A J.Y Gu
%A C Kwon
%A M.C Robson
%A Z Trajanovic
%A K Ghosh
%A R.P Sharma
%A R Shreekala
%A M Rajeswari
%A T Venkatesan
%A Ramamoorthy Ramesh
%A T.W Noh
%B Applied Physics Letters
%D 1997
%G eng
%I American Institute of Physics Inc.
%P 1763-1765
%R 10.1063/1.118649
%T Growth and properties of c-axis textured La0.7Sr0.3MnO3-δ films on SiO2/Si substrates with a Bi4Ti3O12 template layer
%V 70
%X c-axis textured La0.7Sr0.3MnO3-δ(LSMO) films were fabricated on SiO2/Si(001) substrates using a Bi4Ti3O12 (BTO) template layer. Electrical and magnetic properties of LSMO were investigated. The LSMO/BTO layer of this structure has no in-plane alignment. Even though a ferromagnetic transition temperature, Tc, is as high as that of the epitaxial LSMO film (360 K), a resistivity peak temperature, TP, is about 140 K lower than Tc, The resistivity behavior as a function of temperature for LSMO/BTO/SiO2/Si films is found to be dominated by grain boundary effects. Low field sensitive magnetoresistance which suggests spin tunneling through the grain boundaries is also observed at room temperature. © 1997 American Institute of Physics.