%0 Journal Article
%K Optical properties
%K Laser ablation
%K Sapphire
%K Energy gap
%K Aluminum compounds
%K Interfaces (materials)
%K Secondary ion mass spectrometry
%K Spectrophotometry
%K X-ray diffraction analysis
%K Electric conductivity of solids
%K Titanium nitride
%K Aluminum nitride
%K Full width at half maximum (FWHM)
%K Metallic superlattices
%A V Talyansky
%A R.D Vispute
%A Ramamoorthy Ramesh
%A R.P Sharma
%A T Venkatesan
%A Y.X Li
%A L.G Salamanca-Riba
%A M.C Wood
%A R.T Lareau
%A K.A Jones
%A A.A Iliadis
%B Thin Solid Films
%D 1998
%G eng
%I Elsevier
%P 37-41
%R 10.1016/S0040-6090(97)00902-4
%T Fabrication and characterization of epitaxial AlN/TiN bilayers on sapphire
%V 323