%0 Conference Paper
%K Thin films
%K Spectroscopic ellipsometry
%K Film growth
%K Ferroelectric materials
%K Strontium compounds
%K X-ray scattering
%K Lead compounds
%K Interfaces (materials)
%K Ferroelectric thin films
%K Imaging techniques
%K Microscopic examination
%K Spectroscopic analysis
%K Barium compounds
%K Scanning force microscopy (SFM)
%K Ion scattering
%K Recoil spectroscopy
%K Ellipsometry
%A O Auciello
%A A.R Krauss
%A I.M Jaemo
%A A Dhote
%A D.M Gruen
%A S Aggarwal
%A Ramamoorthy Ramesh
%A E.A Irene
%A Yuan Gao
%A A.H Mueller
%B Integrated Ferroelectrics
%D 1999
%G eng
%I Gordon & Breach Science Publ Inc, Newark
%P 103-118
%R 10.1080/10584589908228460
%S Integrated Ferroelectrics
%T Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques
%V 27