%0 Journal Article
%A C.S Ganpule
%A A Stanishevsky
%A Q Su
%A S Aggarwal
%A J Melngailis
%A E Williams
%A Ramamoorthy Ramesh
%B Applied Physics Letters
%D 1999
%G eng
%I American Institute of Physics Inc.
%P 409-411
%R 10.1063/1.124391
%T Scaling of ferroelectric properties in thin films
%V 75