%0 Conference Paper
%K Thin films
%K Spectroscopy
%K Oxygen
%K Lanthanum compounds
%K Strontium
%K Doping (additives)
%K Point defects
%K Positrons
%K Defect structure
%K Oxygen vacancy related defects
%K Positron annihilation spectroscopy
%A T Friessnegg
%A B Nielsen
%A V.J Ghosh
%A A.R Moodenbaugh
%A S Madhukar
%A S Aggarwal
%A D.J Keeble
%A E.H Poindexter
%A P Mascher
%A Ramamoorthy Ramesh
%B Materials Research Society Symposium - Proceedings
%D 1999
%G eng
%P 161-165
%T Defect identification in (La, Sr)CoO3-δ using positron annihilation spectroscopy
%V 541
%X Vacancy type defects in bulk La1-xSrxCoO3-δ samples were investigated by positron lifetime spectroscopy. The effects of Sr-doping as well as the effect of oxygen deficiency were determined. Comparing the resolved lifetimes with calculated values permits defect identification. © 1999 Materials Research Society.