%0 Journal Article
%K Multilayers
%K Lanthanum compounds
%K High temperature superconductors
%K Neodymium compounds
%K Electromagnetic wave polarization
%K Critical current density (superconductivity)
%K Relaxation processes
%K Yttrium barium copper oxides
%K Electric current measurement
%K Electron transport properties
%K Electron tunneling
%K Superconducting devices
%K Critical current suppression
%K Differential current gain
%K Gate electrodes
%K Lanthanum aluminate
%K Lanthanum niobate
%K Neodymium strontium manganate
%K Spin polarized quasiparticle injection
%K Superconducting channel
%K Yttrium barium cuprates
%A I Jin
%A Z Chen
%A T Wu
%A S.P Pai
%A Z Dong
%A S.B Ogale
%A Ramamoorthy Ramesh
%A T Venkatesan
%B IEEE Transactions on Applied Superconductivity
%D 1999
%G eng
%P 3640-3643
%R 10.1109/77.783817
%T Spin-polarized quasiparticle injection into YBCO
%V 9
%X FET-type devices have been fabricated by using trilayers of Nd0.7Sr0.3MnO3 (NSMO) or LaNiO, (LNO) (gate)/ LaAlO3 (LAO) (barrier) / Yba2Cu3O7 (YBCO) (channel) in order to investigate effect of quasiparticle injection into YBCO. Here, NSMO and LNO were used as gate electrodes for injection of spin-polarized and spin-unpolarized quasiparticles into the superconducting channel, respectively. When injecting along the c-axis of YBCO, the critical current was suppressed with spin-polarized qiiasiparticles 30 times more efficiently than with spin-unpolarized quasiparticles. Differential current gain, defîned as a differential change of the critical current to injection current change, has been achieved up to ∼ 16 for c-axis YBCO. If the response time is limited by quasiparticle relaxation time of ∼ 10 ps, the device may be useful for fast electronics. Preliminary high-speed measurements indicate that part of the critical current suppression may be caused by quasiparticle injection, not all by heating. When injecting along a-axis, no significant dependence on quasiparticle polarization was observed. Other superconductors such as Pr1.85Ce0.15CuO4 (PCCO) and Pbln have been tested in similar devices for comparison. © 1999 IEEE.