%0 Journal Article
%A D.E Steinhauer
%A C.P Vlahacos
%A F.C Wellstood
%A S.M Anlage
%A C Canedy
%A Ramamoorthy Ramesh
%A A Stanishevsky
%A J Melngailis
%B Review of Scientific Instruments
%D 2000
%G eng
%I American Institute of Physics Inc.
%P 2751-2758
%R 10.1063/1.1150687
%T Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope
%V 71